You want to learn more about scanning electron microscopy? Watch the short demo recording now!

Scanning electron microscopy (SEM) is used for extremely precise component
microstructure analysis featuring excellent depth of field and super-sharp resolution.
This method generates image captures of the sample surface with very high magnification.

What is SEM analysis in detail? How can you benefit from it? Our presenter Tas Csala gives you a hands-on demonstration how the technology works.